WebJun 15, 2024 · A 3D-optical profilometer (ProFilm3D from Filmetrics, Unterhaching, Germany), was used to measure the roughness of the electrodes and the aptasensors. 2.5. Detection of Furaneol.
Deposition and film parameters of a-SiC:H and a-SiN:H.
WebFilmetrics ® F20 – The world’s first compact, easy-to-use thin-film measurement instrument. The F20 is the first of its kind: an instrument using a miniature fiber-optic … WebMore companies count on Filmetrics ® for affordable thin-film thickness measurements than on anyone else. Makers of cell phones, eyeglasses, liquid-crystal displays, and … Trust us, you’ll be able to understand the technique of spectral reflectance (SR), … Both Spectroscopic Ellipsometry (SE) and Spectral Reflectance (SR) analyze … Get a 3D optical profilometer for less than half the price of an AFM! The Profilm3D … Thin film thickness measurement case studies outlining the benefits of … Single Spot Measurements; Model Thickness Range Wavelength Range … Learn what Filmetrics we have been doing to help the environment Our … clear chuck taylor
Schichtdickenmessung, Schichtdickenmessgeräte von Filmetrics
WebThe Filmetrics F40 uses spectroscopic reflectometry to measure and analyze single layer or multilayer film stacks. The detector is mounted on an optical microscope, so known, selected areas on patterned wafers can be evaluated following deposition or etch steps. The F40 is a valuable WebThe film thickness was determined using spectral reflectance (F20-UVX, Filmetrics, Unterhaching, Germany) and the film stress was measured using capacitive wafer bow gauge (MX203-6-33, E+H ... WebJun 5, 2024 · A. Tandem R2R coating line for high yield printed electronics production Particle contamination is a serious problem in the production of organic electronic devices, a. o., because the functional layers used are rather thin (in the order of 20–200 nm), and any particles of a comparable or larger size pose a high risk for defects. clear chucks